1. W. H. Meiklejohn and C. P. Bean, Phys. Rev. 105, 904 (1956).
2. D. Mauri, H. C. Siegmann, P. S. Bagus and E. Kay, J. Appl. Phys. 62, 3047 (1987).
3. A. P. Malozemoff, Phys. Rev. B 35, 3679 (1987).
4. T. J. Moran, J. M. Gallego and I. K. Schuller, J. Appl. Phys. 78, 1887 (1995).
5. M. Takahashi, A. Yanai, S. Taguchi, and T. Suzuki, Jpn. J. Appl. Phys. 19, 1093 (1980).
6. D.V. Dimitrov, A.S. Murthy, G.C. Hadjipanayis, and C.P. Swann, J. Appl. Phys. 79, 5106 (1996).
7. R. P. Michel, A. Chaiken, Y. K. Kim and L. E. Johnson, "NiO Exchange Bias Layers Grown by Direct Ion Beam Sputtering of a Nickel Oxide Target," IEEE Trans. Mag. 32, 4651 (1996).
8. V.S. Gornakov, V.I. Nikitenko, L.H. Bennett, H.J. Brown, M.J. Donahue, W.F. Egelhoff, R.D. McMichael, and A.J. Shapiro, J. Appl. Phys. 81, 5215 (1997).
9. V.I. Nikitenko and L.M. Dedukh, Phys. Stat. Sol. (a) 3, 383 (1970).