Figure 1:
MOIF image of the domain structure in a NiO/NiFe bilayer (arrow indicates the direction of an applied field, H = 6 Oe). (b) Surface steps associated with screw dislocation slip planes revealed in reflected light at the NiFe surface. (c) Microstress fields caused by the slip planes of edge dislocations revealed by a optical birefringence. All 3 images are of the same region and orientation.