Remaining Challenges

  • Thin cap necessitated by e-beam readback may not be compatible with unlimited cyclability.

  • High defect density may be intrinsic to high-EBIC or easy-recrystallizing InSe films.

  • Slow recrystallization time may limit device data rate.

  • Phase segregation, interdiffusion may appear at higher cycle number.

  • Qualitatively different effects may occur with electron-beam writing or at nanometric bit diameters.

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