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Figure 1: (1K) Magnetization curves for three Fe/Si multilayers. The y-axis shows magnetization data normalized to the saturated value. The solid line indicates data for a polycrystalline (Fe30Å/Si20Å)x50 multilayer which has a magnetization curve much like bulk Fe. The open circles indicate data for an epitaxial (Fe40Å/Si14Å)x40 multilayer which has the high saturation field and low remanent magnetization that are characteristic of antiferromagnetic interlayer exchange coupling. The polycrystalline (Fe30Å/Si14Å)x50 multilayer (indicated by filled circles) has weaker antiferromagnetic coupling than the epitaxial multilayer.
Figure 2: (1K) SXF Si L-emission spectra for crystalline and amorphous silicon films. These data were taken with an incident photon energy of 132 eV.
Figure 3: (1K) SXF
Si L-emission spectra for an FeSi2 reference
sample and for the two polycrystalline Fe/Si multilayers
whose magnetization curves are shown in Figure 1. The
incident photon energy was 132 eV. The data labelled
``Uncoupled ML'' is from the (Fe30Å/Si20Å)x50
multilayer grown on glass. The data labelled ``AF-coupled
ML'' is from the antiferromagnetically coupled
(Fe30Å/Si14Å)x50 multilayer grown on glass.
Figure 4: (1K) SXF
Si L-emission spectra (solid line) and Si L-edge NEXAFS
(dashed line) for the crystalline Si reference film and for
the epitaxial (Fe40Å/Si14Å)x40 multilayer on MgO.
The crossing of the valence band data obtained from SXF and
the conduction band data obtained from NEXAFS demonstrates
that the silicide spacer layer is metallic.