Figure 4





Missing Fe magnetic moment expressed as an equivalent thickness of Fe plotted versus missing bilayer period as obtained from fits to small-angle x-ray diffraction data. Symbols indicate different nominal Si layer thicknesses and different film textures. The film labelled ``LN'' was grown on a LN-cooled substrate; all others were grown at nominal RT. All multilayers have 40 or 50 repeats and were grown on either glass or oxidized Si substrates.


alchaiken@gmail.com (Alison Chaiken)
Wed Oct 11 01:35:04 PDT 1995