A. Chaiken Physics Papers

Transmission Electron Microscopy Study of Heteroepitaxial Growth in the BiSrCaCuO System

A. Chaiken, M.A. Wall, and R.H. Howell,
Materials Science and Technology Division
Lawrence Livermore National Laboratory
Livermore, CA 94550

I. Bozovic, J. N. Eckstein, and G.F. Virshup
E. L. Ginzton Research Laboratory
Varian Associates, Inc.
Palo Alto, CA 94304-1025

J. Mater. Res. 11, 1609 (1996).

Abstract:

Films of Bi₂Sr₂CaCu₂O₈ and Bi₂Sr₂CuO₆ have been grown using Atomic-Layer-by-Layer Molecular Beam Epitaxy (ALL-MBE) on lattice-matched substrates. These materials have been combined with layers of closely-related metastable compounds like Bi₂Sr₂Ca₇Cu₈O ₂₀ (2278) and rare-earth-doped compounds like Bi₂Sr₂Dy_xCa_1-xCu ₂O₈ (Dy:2212) to form heterostructures with unique superconducting properties, including superconductor/insulator multilayers and tunnel junctions. Transmission electron microscopy (TEM) has been used to study the morphology and microstructure of these heterostructures. These TEM studies shed light on the physical properties of the films, and give insight into the growth mode of highly anisotropic solids like Bi₂Sr₂CaCu₂O₈.

• Introduction
• Experimental
• Results
  • 2212 overgrowth on SrTiO
  • 2201/2212 Superlattices
  • 2212/2278 Heterostructures
  • Defects in 2212-based Heterostructures
• Conclusions
• References
• Figures