Figure 1: MOIF image
of the domain structure in a NiO/NiFe bilayer (arrow
indicates the direction of an applied field, H = 6 Oe). (b)
Surface steps associated with screw dislocation slip planes
revealed in reflected light at the NiFe surface. (c)
Microstress fields caused by the slip planes of edge
dislocations revealed by a optical birefringence. All 3
images are of the same region and orientation. (157K)
Figure 2: Magnetic
hysteresis loop (a) and MOIF images of domain structure (b -
f) taken at the unidirectional-axis magnetization reversal of
NiO/NiFe bilayer. Figs. b to h correspond to the conditions
indicated by the circles labelled by the same letters on the
hysteresis loop in Fig. 2a. The vertical right-hand band
perpendicular to the unidirectional axis is the edge of the
bilayer, revealed due to magnetic stray fields. Arrows
indicate magnetization directions in domains. (126K)
Figure 3:
Hysteresis loop (a) and MOIF images of magnetic structure (b
to d) observed during hard axis magnetization reversal of a
NiO/NiFe bilayer. (104K)