Figure 1: High-angle
x-ray diffraction spectra from two
(Fe40Å/Si14Å)x60 multilayers grown on different
substrates. High-angle x-ray peaks give information about
lattice constants and stacking within the layers. The
multilayer grown on MgO(001) has an Fe(002) peak with 4
satellites. The multilayer simultaneously grown on glass has
only an Fe(011) peak.
Figure 2: Low-angle
x-ray diffraction spectra for the same two
(Fe40Å/Si14Å)x60 multilayers. Low-angle x-ray
peaks give information about the bilayer period and layering
of the multilayer. The multilayer grown on MgO has four
relatively narrow peaks. The multilayer grown on glass has
only two broad peaks, indicating a greater degree of
interface roughness.
Figure 3a:
Magnetization curves for Fe/Si multilayers grown on various
substrates. The magnetization data is normalized to the
highest measured value in order to facilitate comparison of
the shape of the two data sets. a) Hysteresis loops for the
(Fe40Å/Si14Å)x60 multilayers simultaneously grown
on MgO (001) and glass. The remanence is lower for the film
grown on MgO.
Figure 3b:
Hysteresis loops for (Fe100Å/Si14Å)x2 multilayers
(trilayers) grown on Al2O3 (1120),
Ge(001), and MgO(001). All data are taken with the applied
magnetic field along the Fe (100) easy direction.