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Transmission Electron Microscopy Study of Heteroepitaxial Growth in the BiSrCaCuO System

A. Chaiken, M.A. Wall, and R.H. Howell,
Materials Science and Technology Division
Lawrence Livermore National Laboratory
Livermore, CA 94550

I. Bozovic, J. N. Eckstein, and G.F. Virshup
E. L. Ginzton Research Laboratory
Varian Associates, Inc.
Palo Alto, CA 94304-1025

J. Mater. Res. 11, 1609 (1996).


Films of Bi2Sr2CaCu2O8 and Bi2Sr2CuO6 have been grown using Atomic-Layer-by-Layer Molecular Beam Epitaxy (ALL-MBE) on lattice-matched substrates. These materials have been combined with layers of closely-related metastable compounds like Bi2Sr2Ca7Cu8O 20 (2278) and rare-earth-doped compounds like Bi2Sr2DyxCa1-xCu 2O8 (Dy:2212) to form heterostructures with unique superconducting properties, including superconductor/insulator multilayers and tunnel junctions. Transmission electron microscopy (TEM) has been used to study the morphology and microstructure of these heterostructures. These TEM studies shed light on the physical properties of the films, and give insight into the growth mode of highly anisotropic solids like Bi2Sr2CaCu2O8.

Send email to alison (Alison Chaiken) if you want a preprint with figures
Sat Jan 20 14:12:46 PST 1996